High resolution imaging using the Oxford aberration corrected TEM
मुख्य लेखकों: | Hetherington, C, Kirkland, A, Doole, R, Cockayne, D, Titchmarsh, J, Hutchison, J |
---|---|
स्वरूप: | Journal article |
भाषा: | English |
प्रकाशित: |
2006
|
समान संसाधन
-
Aberration-corrected HREM/STEM for semiconductor research
द्वारा: Hetherington, C, और अन्य
प्रकाशित: (2005) -
Experimental evaluation of a spherical aberration-corrected TEM and STEM.
द्वारा: Sawada, H, और अन्य
प्रकाशित: (2005) -
A versatile double aberration-corrected, energy filtered HREM/STEM for materials science.
द्वारा: Hutchison, J, और अन्य
प्रकाशित: (2005) -
Prospective applications for a double-C-s-corrector TEM/STEM
द्वारा: Mobus, G, और अन्य
प्रकाशित: (2001) -
High-resolution TEM and the application of direct and indirect aberration correction.
द्वारा: Hetherington, C, और अन्य
प्रकाशित: (2008)