High resolution imaging using the Oxford aberration corrected TEM

Παρόμοια τεκμήρια

• Aberration-corrected HREM/STEM for semiconductor research
  ανά: Hetherington, C, κ.ά.
  Έκδοση: (2005)
• Experimental evaluation of a spherical aberration-corrected TEM and STEM.
  ανά: Sawada, H, κ.ά.
  Έκδοση: (2005)
• A versatile double aberration-corrected, energy filtered HREM/STEM for materials science.
  ανά: Hutchison, J, κ.ά.
  Έκδοση: (2005)
• Prospective applications for a double-C-s-corrector TEM/STEM
  ανά: Mobus, G, κ.ά.
  Έκδοση: (2001)
• High-resolution TEM and the application of direct and indirect aberration correction.
  ανά: Hetherington, C, κ.ά.
  Έκδοση: (2008)