High resolution imaging using the Oxford aberration corrected TEM

Samankaltaisia teoksia

• Aberration-corrected HREM/STEM for semiconductor research
  Tekijä: Hetherington, C, et al.
  Julkaistu: (2005)
• Experimental evaluation of a spherical aberration-corrected TEM and STEM.
  Tekijä: Sawada, H, et al.
  Julkaistu: (2005)
• A versatile double aberration-corrected, energy filtered HREM/STEM for materials science.
  Tekijä: Hutchison, J, et al.
  Julkaistu: (2005)
• Prospective applications for a double-C-s-corrector TEM/STEM
  Tekijä: Mobus, G, et al.
  Julkaistu: (2001)
• High-resolution TEM and the application of direct and indirect aberration correction.
  Tekijä: Hetherington, C, et al.
  Julkaistu: (2008)