Microstructural investigation of Cu/Co multilayer films
Multilayer film structures, with applications based on the giant-magnetoresistance principle, comprise an exciting area of research and have the capability to improve the storage density and sensitivity of devices used by the magnetic recording industry. In order to optimise the performance of these...
المؤلفون الرئيسيون: | Larson, D, Petford-Long, A, Cerezo, A |
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التنسيق: | Conference item |
منشور في: |
1999
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مواد مشابهة
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Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures
حسب: Larson, D, وآخرون
منشور في: (1998) -
Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures
حسب: Larson, D, وآخرون
منشور في: (1999) -
Atom probe analysis of roughness and chemical intermixing in CoFe/Cu films (invited)
حسب: Larson, D, وآخرون
منشور في: (2001) -
Three-dimensional atom probe studies of metallic multilayers
حسب: Larson, D, وآخرون
منشور في: (1999) -
Atomic-scale analysis of CoFe/Cu and CoFe/NiFe interfaces
حسب: Larson, D, وآخرون
منشور في: (2000)