Microstructural investigation of Cu/Co multilayer films
Multilayer film structures, with applications based on the giant-magnetoresistance principle, comprise an exciting area of research and have the capability to improve the storage density and sensitivity of devices used by the magnetic recording industry. In order to optimise the performance of these...
Autors principals: | Larson, D, Petford-Long, A, Cerezo, A |
---|---|
Format: | Conference item |
Publicat: |
1999
|
Ítems similars
-
Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures
per: Larson, D, et al.
Publicat: (1998) -
Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures
per: Larson, D, et al.
Publicat: (1999) -
Atom probe analysis of roughness and chemical intermixing in CoFe/Cu films (invited)
per: Larson, D, et al.
Publicat: (2001) -
Three-dimensional atom probe studies of metallic multilayers
per: Larson, D, et al.
Publicat: (1999) -
Atomic-scale analysis of CoFe/Cu and CoFe/NiFe interfaces
per: Larson, D, et al.
Publicat: (2000)