Microstructural investigation of Cu/Co multilayer films
Multilayer film structures, with applications based on the giant-magnetoresistance principle, comprise an exciting area of research and have the capability to improve the storage density and sensitivity of devices used by the magnetic recording industry. In order to optimise the performance of these...
Κύριοι συγγραφείς: | Larson, D, Petford-Long, A, Cerezo, A |
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Μορφή: | Conference item |
Έκδοση: |
1999
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Παρόμοια τεκμήρια
Παρόμοια τεκμήρια
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Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures
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Έκδοση: (1998) -
Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures
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Έκδοση: (1999) -
Atom probe analysis of roughness and chemical intermixing in CoFe/Cu films (invited)
ανά: Larson, D, κ.ά.
Έκδοση: (2001) -
Three-dimensional atom probe studies of metallic multilayers
ανά: Larson, D, κ.ά.
Έκδοση: (1999) -
Atomic-scale analysis of CoFe/Cu and CoFe/NiFe interfaces
ανά: Larson, D, κ.ά.
Έκδοση: (2000)