Microstructural investigation of Cu/Co multilayer films
Multilayer film structures, with applications based on the giant-magnetoresistance principle, comprise an exciting area of research and have the capability to improve the storage density and sensitivity of devices used by the magnetic recording industry. In order to optimise the performance of these...
Main Authors: | Larson, D, Petford-Long, A, Cerezo, A |
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פורמט: | Conference item |
יצא לאור: |
1999
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פריטים דומים
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Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures
מאת: Larson, D, et al.
יצא לאור: (1998) -
Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures
מאת: Larson, D, et al.
יצא לאור: (1999) -
Atom probe analysis of roughness and chemical intermixing in CoFe/Cu films (invited)
מאת: Larson, D, et al.
יצא לאור: (2001) -
Three-dimensional atom probe studies of metallic multilayers
מאת: Larson, D, et al.
יצא לאור: (1999) -
Atomic-scale analysis of CoFe/Cu and CoFe/NiFe interfaces
מאת: Larson, D, et al.
יצא לאור: (2000)