Microstructural investigation of Cu/Co multilayer films
Multilayer film structures, with applications based on the giant-magnetoresistance principle, comprise an exciting area of research and have the capability to improve the storage density and sensitivity of devices used by the magnetic recording industry. In order to optimise the performance of these...
Үндсэн зохиолчид: | Larson, D, Petford-Long, A, Cerezo, A |
---|---|
Формат: | Conference item |
Хэвлэсэн: |
1999
|
Ижил төстэй зүйлс
-
Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures
-н: Larson, D, зэрэг
Хэвлэсэн: (1998) -
Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures
-н: Larson, D, зэрэг
Хэвлэсэн: (1999) -
Atom probe analysis of roughness and chemical intermixing in CoFe/Cu films (invited)
-н: Larson, D, зэрэг
Хэвлэсэн: (2001) -
Three-dimensional atom probe studies of metallic multilayers
-н: Larson, D, зэрэг
Хэвлэсэн: (1999) -
Atomic-scale analysis of CoFe/Cu and CoFe/NiFe interfaces
-н: Larson, D, зэрэг
Хэвлэсэн: (2000)