Probing deformation substructure by synchrotron X-ray diffraction and dislocation dynamics modelling.
Materials characterization at the nano-scale is motivated by the desire to resolve the structural aspects and deformation behavior at length scales relevant to those mechanisms that define the novel and unusual properties of nano-structured materials. A range of novel techniques has recently become...
| Main Authors: | , , , , |
|---|---|
| 格式: | Journal article |
| 語言: | English |
| 出版: |
2010
|