Direct observations of defect structures in optoelectronic materials by Z-contrast stem

Míreanna comhchosúla

• Direct observations of atomic structures of defects in GaN by high resolution Z-contrast stem
  de réir: Xin, Y, et al.
  Foilsithe / Cruthaithe: (1998)
• Direct observation of the core structures of threading dislocations in GaN
  de réir: Xin, Y, et al.
  Foilsithe / Cruthaithe: (1998)
• On the origin of transverse incoherence in Z-contrast STEM.
  de réir: Rafferty, B, et al.
  Foilsithe / Cruthaithe: (2001)
• Investigation of the evolution of single domain, (111) B CdTe films by molecular beam epitaxy on miscut (001) Si substrate
  de réir: Xin, Y, et al.
  Foilsithe / Cruthaithe: (1998)
• Z-contrast scanning transmission electron microscopy
  de réir: Pennycook, S, et al.
  Foilsithe / Cruthaithe: (1999)