Direct observations of defect structures in optoelectronic materials by Z-contrast stem
| Autori principali: | , , , , , , , , , , |
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| Natura: | Conference item |
| Pubblicazione: |
1998
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| _version_ | 1826257488331145216 |
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| author | Xin, Y Browning, N Pennycook, S Nellist, P Chen, Y Rujirawat, S Sivananthan, S Omnes, F Beaumont, B Faurie, J Gibart, P |
| author_facet | Xin, Y Browning, N Pennycook, S Nellist, P Chen, Y Rujirawat, S Sivananthan, S Omnes, F Beaumont, B Faurie, J Gibart, P |
| author_sort | Xin, Y |
| collection | OXFORD |
| description | |
| first_indexed | 2024-03-06T18:19:01Z |
| format | Conference item |
| id | oxford-uuid:05a0a0b5-7264-497c-af17-ab75b376574b |
| institution | University of Oxford |
| last_indexed | 2024-03-06T18:19:01Z |
| publishDate | 1998 |
| record_format | dspace |
| spelling | oxford-uuid:05a0a0b5-7264-497c-af17-ab75b376574b2022-03-26T08:58:11ZDirect observations of defect structures in optoelectronic materials by Z-contrast stemConference itemhttp://purl.org/coar/resource_type/c_5794uuid:05a0a0b5-7264-497c-af17-ab75b376574bSymplectic Elements at Oxford1998Xin, YBrowning, NPennycook, SNellist, PChen, YRujirawat, SSivananthan, SOmnes, FBeaumont, BFaurie, JGibart, P |
| spellingShingle | Xin, Y Browning, N Pennycook, S Nellist, P Chen, Y Rujirawat, S Sivananthan, S Omnes, F Beaumont, B Faurie, J Gibart, P Direct observations of defect structures in optoelectronic materials by Z-contrast stem |
| title | Direct observations of defect structures in optoelectronic materials by Z-contrast stem |
| title_full | Direct observations of defect structures in optoelectronic materials by Z-contrast stem |
| title_fullStr | Direct observations of defect structures in optoelectronic materials by Z-contrast stem |
| title_full_unstemmed | Direct observations of defect structures in optoelectronic materials by Z-contrast stem |
| title_short | Direct observations of defect structures in optoelectronic materials by Z-contrast stem |
| title_sort | direct observations of defect structures in optoelectronic materials by z contrast stem |
| work_keys_str_mv | AT xiny directobservationsofdefectstructuresinoptoelectronicmaterialsbyzcontraststem AT browningn directobservationsofdefectstructuresinoptoelectronicmaterialsbyzcontraststem AT pennycooks directobservationsofdefectstructuresinoptoelectronicmaterialsbyzcontraststem AT nellistp directobservationsofdefectstructuresinoptoelectronicmaterialsbyzcontraststem AT cheny directobservationsofdefectstructuresinoptoelectronicmaterialsbyzcontraststem AT rujirawats directobservationsofdefectstructuresinoptoelectronicmaterialsbyzcontraststem AT sivananthans directobservationsofdefectstructuresinoptoelectronicmaterialsbyzcontraststem AT omnesf directobservationsofdefectstructuresinoptoelectronicmaterialsbyzcontraststem AT beaumontb directobservationsofdefectstructuresinoptoelectronicmaterialsbyzcontraststem AT fauriej directobservationsofdefectstructuresinoptoelectronicmaterialsbyzcontraststem AT gibartp directobservationsofdefectstructuresinoptoelectronicmaterialsbyzcontraststem |