Direct observations of defect structures in optoelectronic materials by Z-contrast stem

Detalhes bibliográficos
Principais autores:	Xin, Y, Browning, N, Pennycook, S, Nellist, P, Chen, Y, Rujirawat, S, Sivananthan, S, Omnes, F, Beaumont, B, Faurie, J, Gibart, P
Formato:	Conference item
Publicado em:	1998

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