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Direct observations of defect...
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Direct observations of defect structures in optoelectronic materials by Z-contrast stem
Bibliografiska uppgifter
Huvudupphovsmän:
Xin, Y
,
Browning, N
,
Pennycook, S
,
Nellist, P
,
Chen, Y
,
Rujirawat, S
,
Sivananthan, S
,
Omnes, F
,
Beaumont, B
,
Faurie, J
,
Gibart, P
Materialtyp:
Conference item
Publicerad:
1998
Beståndsuppgifter
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Katalogiseringsuppgifter
Liknande verk
Direct observations of atomic structures of defects in GaN by high resolution Z-contrast stem
av: Xin, Y, et al.
Publicerad: (1998)
Direct observation of the core structures of threading dislocations in GaN
av: Xin, Y, et al.
Publicerad: (1998)
Investigation of the evolution of single domain, (111) B CdTe films by molecular beam epitaxy on miscut (001) Si substrate
av: Xin, Y, et al.
Publicerad: (1998)
On the origin of transverse incoherence in Z-contrast STEM.
av: Rafferty, B, et al.
Publicerad: (2001)
Z-contrast scanning transmission electron microscopy
av: Pennycook, S, et al.
Publicerad: (1999)