Direct observations of defect structures in optoelectronic materials by Z-contrast stem

相似書籍

• Direct observations of atomic structures of defects in GaN by high resolution Z-contrast stem
  由: Xin, Y, et al.
  出版: (1998)
• Direct observation of the core structures of threading dislocations in GaN
  由: Xin, Y, et al.
  出版: (1998)
• Investigation of the evolution of single domain, (111) B CdTe films by molecular beam epitaxy on miscut (001) Si substrate
  由: Xin, Y, et al.
  出版: (1998)
• On the origin of transverse incoherence in Z-contrast STEM.
  由: Rafferty, B, et al.
  出版: (2001)
• Z-contrast scanning transmission electron microscopy
  由: Pennycook, S, et al.
  出版: (1999)