Cita APA (7th ed.)

Van Den Bos, K., Janssens, L., De Backer, A., Nellist, P., & Van Aert, S. (2018). The atomic lensing model: New opportunities for atom-by-atom metrology of heterogeneous nanomaterials. Elsevier.

Cita Chicago (17th ed.)

Van Den Bos, K., L. Janssens, A. De Backer, P. Nellist, i S. Van Aert. The Atomic Lensing Model: New Opportunities for Atom-by-atom Metrology of Heterogeneous Nanomaterials. Elsevier, 2018.

Cita MLA (9th ed.)

Van Den Bos, K., et al. The Atomic Lensing Model: New Opportunities for Atom-by-atom Metrology of Heterogeneous Nanomaterials. Elsevier, 2018.