APA引文

Van Den Bos, K., Janssens, L., De Backer, A., Nellist, P., & Van Aert, S. (2018). The atomic lensing model: New opportunities for atom-by-atom metrology of heterogeneous nanomaterials. Elsevier.

芝加哥风格引文

Van Den Bos, K., L. Janssens, A. De Backer, P. Nellist, 与 S. Van Aert. The Atomic Lensing Model: New Opportunities for Atom-by-atom Metrology of Heterogeneous Nanomaterials. Elsevier, 2018.

MLA引文

Van Den Bos, K., et al. The Atomic Lensing Model: New Opportunities for Atom-by-atom Metrology of Heterogeneous Nanomaterials. Elsevier, 2018.