The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials

The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials

The atomic lensing model has been proposed as a promising method facilitating atom-counting in heterogeneous nanocrystals [1]. Here, image simulations will validate the model, which describes dynamical diffraction as a superposition of individual atoms focussing the incident electrons. It will be de...

書誌詳細
主要な著者:	Van Den Bos, K, Janssens, L, De Backer, A, Nellist, P, Van Aert, S
フォーマット:	Journal article
言語:	English
出版事項:	Elsevier 2018

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