The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials

The atomic lensing model has been proposed as a promising method facilitating atom-counting in heterogeneous nanocrystals [1]. Here, image simulations will validate the model, which describes dynamical diffraction as a superposition of individual atoms focussing the incident electrons. It will be de...

Disgrifiad llawn

Manylion Llyfryddiaeth
Prif Awduron: Van Den Bos, K, Janssens, L, De Backer, A, Nellist, P, Van Aert, S
Fformat: Journal article
Iaith:English
Cyhoeddwyd: Elsevier 2018

Eitemau Tebyg