The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials
The atomic lensing model has been proposed as a promising method facilitating atom-counting in heterogeneous nanocrystals [1]. Here, image simulations will validate the model, which describes dynamical diffraction as a superposition of individual atoms focussing the incident electrons. It will be de...
| Egile Nagusiak: | , , , , |
|---|---|
| Formatua: | Journal article |
| Hizkuntza: | English |
| Argitaratua: |
Elsevier
2018
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