Mining information from atom probe data

Whilst atom probe tomography (APT) is a powerful technique with the capacity to gather information containing hundreds of millions of atoms from a single specimen, the ability to effectively use this information creates significant challenges. The main technological bottleneck lies in handling the e...

詳細記述

書誌詳細
主要な著者: Cairney, J, Rajan, K, Haley, D, Gault, B, Bagot, P, Choi, P, Felfer, P, Ringer, S, Marceau, R, Moody, M
フォーマット: Journal article
言語:English
出版事項: Elsevier 2015