| Summary: | The use of specular neutron reflection to determine the structure and composition of mixed surfactant layers adsorbed at the liquid-solid interface is described. The structure of the bilayer formed at the hydrophilic silicon-aqueous solution interface by the mixed cationic/non-ionic surfactant mixture of hexadecyltrimethyl ammonium bromide, C16TAB, and hexaethylene glycol monododecyl ether, C12E6, is described. The role of measurements using different isotopic (hydrogen/deuterium) labelling of the surfactant and solvent is highlighted, and the need to accurately characterise the native oxide layer on the surface of the silicon is discussed. © 1998 Elsevier Science B.V. All rights reserved.
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