Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope

Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope

Bibliographic Details
Main Authors:	Nellist, P, Cosgriff, E, Behan, G, Kirkland, A, D'Alfonso, A, Findlay, S, Allen, L
Format:	Book section
Language:	English
Published:	Springer Berlin Heidelberg 2008
Subjects:	Materials Sciences

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