ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON
| Main Authors: | , , , , |
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| Format: | Journal article |
| Published: |
1993
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| _version_ | 1826258608447291392 |
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| author | Wilkinson, A Anstis, G Czernuszka, J Long, N Hirsch, P |
| author_facet | Wilkinson, A Anstis, G Czernuszka, J Long, N Hirsch, P |
| author_sort | Wilkinson, A |
| collection | OXFORD |
| description | |
| first_indexed | 2024-03-06T18:36:39Z |
| format | Journal article |
| id | oxford-uuid:0b7a43f8-dfe0-475e-951a-d0d35215b285 |
| institution | University of Oxford |
| last_indexed | 2024-03-06T18:36:39Z |
| publishDate | 1993 |
| record_format | dspace |
| spelling | oxford-uuid:0b7a43f8-dfe0-475e-951a-d0d35215b2852022-03-26T09:29:31ZELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICONJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:0b7a43f8-dfe0-475e-951a-d0d35215b285Symplectic Elements at Oxford1993Wilkinson, AAnstis, GCzernuszka, JLong, NHirsch, P |
| spellingShingle | Wilkinson, A Anstis, G Czernuszka, J Long, N Hirsch, P ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON |
| title | ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON |
| title_full | ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON |
| title_fullStr | ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON |
| title_full_unstemmed | ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON |
| title_short | ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON |
| title_sort | electron channeling contrast imaging of interfacial defects in strained silicon germanium layers on silicon |
| work_keys_str_mv | AT wilkinsona electronchannelingcontrastimagingofinterfacialdefectsinstrainedsilicongermaniumlayersonsilicon AT anstisg electronchannelingcontrastimagingofinterfacialdefectsinstrainedsilicongermaniumlayersonsilicon AT czernuszkaj electronchannelingcontrastimagingofinterfacialdefectsinstrainedsilicongermaniumlayersonsilicon AT longn electronchannelingcontrastimagingofinterfacialdefectsinstrainedsilicongermaniumlayersonsilicon AT hirschp electronchannelingcontrastimagingofinterfacialdefectsinstrainedsilicongermaniumlayersonsilicon |