Automated Test Pattern Generation for Quantum Circuits
This work extends a general method used to test classical circuits to quantum circuits. Gate internal errors are address using a discrete fault model. Fault models to represent unwanted nearest neighbor entanglement as well as unwanted qubit rotation are presented. When witnessed, the faults we mode...
| Main Authors: | , |
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| Format: | Journal article |
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2005
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| _version_ | 1826259039268372480 |
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| author | Biamonte, J Perkowski, M |
| author_facet | Biamonte, J Perkowski, M |
| author_sort | Biamonte, J |
| collection | OXFORD |
| description | This work extends a general method used to test classical circuits to quantum circuits. Gate internal errors are address using a discrete fault model. Fault models to represent unwanted nearest neighbor entanglement as well as unwanted qubit rotation are presented. When witnessed, the faults we model are probabilistic, but there is a set of tests with the highest probability of detecting a discrete repetitive fault. A method of probabilistic set covering to identify the minimal set of tests is introduced. A large part of our work consisted of writing a software package that allows us to compare various fault models and test strategies for quantum networks. |
| first_indexed | 2024-03-06T18:43:34Z |
| format | Journal article |
| id | oxford-uuid:0dbb0184-44f8-465a-8f9c-077d81df720a |
| institution | University of Oxford |
| last_indexed | 2024-03-06T18:43:34Z |
| publishDate | 2005 |
| record_format | dspace |
| spelling | oxford-uuid:0dbb0184-44f8-465a-8f9c-077d81df720a2022-03-26T09:42:04ZAutomated Test Pattern Generation for Quantum CircuitsJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:0dbb0184-44f8-465a-8f9c-077d81df720aDepartment of Computer Science2005Biamonte, JPerkowski, MThis work extends a general method used to test classical circuits to quantum circuits. Gate internal errors are address using a discrete fault model. Fault models to represent unwanted nearest neighbor entanglement as well as unwanted qubit rotation are presented. When witnessed, the faults we model are probabilistic, but there is a set of tests with the highest probability of detecting a discrete repetitive fault. A method of probabilistic set covering to identify the minimal set of tests is introduced. A large part of our work consisted of writing a software package that allows us to compare various fault models and test strategies for quantum networks. |
| spellingShingle | Biamonte, J Perkowski, M Automated Test Pattern Generation for Quantum Circuits |
| title | Automated Test Pattern Generation for Quantum Circuits |
| title_full | Automated Test Pattern Generation for Quantum Circuits |
| title_fullStr | Automated Test Pattern Generation for Quantum Circuits |
| title_full_unstemmed | Automated Test Pattern Generation for Quantum Circuits |
| title_short | Automated Test Pattern Generation for Quantum Circuits |
| title_sort | automated test pattern generation for quantum circuits |
| work_keys_str_mv | AT biamontej automatedtestpatterngenerationforquantumcircuits AT perkowskim automatedtestpatterngenerationforquantumcircuits |