A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation
Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in various facilities worldwide. The resolution of the monitor i...
| Main Authors: | , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2010
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| Summary: | Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in various facilities worldwide. The resolution of the monitor is defined by so-called Point Spread Function (PSF), source distribution generated by a single electron and projected by an optical system onto a screen. In this paper we represent the development of a novel sub-micrometre electron beam profile monitor based on the measurements of the PSF structure. The first experimental results are presented and future plans on the optimization of the monitor are discussed © 2010 IOP Publishing Ltd. |
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