A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation
Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in various facilities worldwide. The resolution of the monitor i...
| Váldodahkkit: | , , , , , |
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| Materiálatiipa: | Journal article |
| Giella: | English |
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2010
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| _version_ | 1826259117946175488 |
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| author | Aryshev, A Boogert, S Howell, D Karataev, P Terunuma, N Urakawa, J |
| author_facet | Aryshev, A Boogert, S Howell, D Karataev, P Terunuma, N Urakawa, J |
| author_sort | Aryshev, A |
| collection | OXFORD |
| description | Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in various facilities worldwide. The resolution of the monitor is defined by so-called Point Spread Function (PSF), source distribution generated by a single electron and projected by an optical system onto a screen. In this paper we represent the development of a novel sub-micrometre electron beam profile monitor based on the measurements of the PSF structure. The first experimental results are presented and future plans on the optimization of the monitor are discussed © 2010 IOP Publishing Ltd. |
| first_indexed | 2024-03-06T18:44:48Z |
| format | Journal article |
| id | oxford-uuid:0e2341b7-ab11-4940-b916-8029588b6c04 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-06T18:44:48Z |
| publishDate | 2010 |
| record_format | dspace |
| spelling | oxford-uuid:0e2341b7-ab11-4940-b916-8029588b6c042022-03-26T09:44:19ZA novel method for sub-micrometer transverse electron beam size measurements using optical transition radiationJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:0e2341b7-ab11-4940-b916-8029588b6c04EnglishSymplectic Elements at Oxford2010Aryshev, ABoogert, SHowell, DKarataev, PTerunuma, NUrakawa, JOptical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in various facilities worldwide. The resolution of the monitor is defined by so-called Point Spread Function (PSF), source distribution generated by a single electron and projected by an optical system onto a screen. In this paper we represent the development of a novel sub-micrometre electron beam profile monitor based on the measurements of the PSF structure. The first experimental results are presented and future plans on the optimization of the monitor are discussed © 2010 IOP Publishing Ltd. |
| spellingShingle | Aryshev, A Boogert, S Howell, D Karataev, P Terunuma, N Urakawa, J A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation |
| title | A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation |
| title_full | A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation |
| title_fullStr | A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation |
| title_full_unstemmed | A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation |
| title_short | A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation |
| title_sort | novel method for sub micrometer transverse electron beam size measurements using optical transition radiation |
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