Direct imaging of rotational stacking faults in few layer graphene

Few layer graphene nanostructures are directiy imaged using aberration corrected high-resolution transmission electron microscopy with an electron accelerating voltage of 80 kV. We observe rotational stacking faults in the HRTEM images of 2-6 layers of graphene sheets, giving rise to Moiré patterns....

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Auteurs principaux: Warner, J, Rümmeli, M, Gemming, T, Büchner, B, Briggs, G
Format: Journal article
Langue:English
Publié: 2009
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author Warner, J
Rümmeli, M
Gemming, T
Büchner, B
Briggs, G
author_facet Warner, J
Rümmeli, M
Gemming, T
Büchner, B
Briggs, G
author_sort Warner, J
collection OXFORD
description Few layer graphene nanostructures are directiy imaged using aberration corrected high-resolution transmission electron microscopy with an electron accelerating voltage of 80 kV. We observe rotational stacking faults in the HRTEM images of 2-6 layers of graphene sheets, giving rise to Moiré patterns. By filtering in the frequency domain using a Fourier transform, we reconstruct the graphene lattice of each sheet and determine the packing structure and relative orientations of up to six separate sets. Direct evidence is obtained for few layer graphene sheets with packing that is different to the standard AB Bernal packing of bulk graphite. This has implications toward bilayer and few layer graphene electronic devices and the determination of their intrinsic structure. © 2009 American Chemical Society.
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spelling oxford-uuid:10801f9b-d79a-455a-a6be-490a582d54d22022-03-26T09:56:49ZDirect imaging of rotational stacking faults in few layer grapheneJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:10801f9b-d79a-455a-a6be-490a582d54d2EnglishSymplectic Elements at Oxford2009Warner, JRümmeli, MGemming, TBüchner, BBriggs, GFew layer graphene nanostructures are directiy imaged using aberration corrected high-resolution transmission electron microscopy with an electron accelerating voltage of 80 kV. We observe rotational stacking faults in the HRTEM images of 2-6 layers of graphene sheets, giving rise to Moiré patterns. By filtering in the frequency domain using a Fourier transform, we reconstruct the graphene lattice of each sheet and determine the packing structure and relative orientations of up to six separate sets. Direct evidence is obtained for few layer graphene sheets with packing that is different to the standard AB Bernal packing of bulk graphite. This has implications toward bilayer and few layer graphene electronic devices and the determination of their intrinsic structure. © 2009 American Chemical Society.
spellingShingle Warner, J
Rümmeli, M
Gemming, T
Büchner, B
Briggs, G
Direct imaging of rotational stacking faults in few layer graphene
title Direct imaging of rotational stacking faults in few layer graphene
title_full Direct imaging of rotational stacking faults in few layer graphene
title_fullStr Direct imaging of rotational stacking faults in few layer graphene
title_full_unstemmed Direct imaging of rotational stacking faults in few layer graphene
title_short Direct imaging of rotational stacking faults in few layer graphene
title_sort direct imaging of rotational stacking faults in few layer graphene
work_keys_str_mv AT warnerj directimagingofrotationalstackingfaultsinfewlayergraphene
AT rummelim directimagingofrotationalstackingfaultsinfewlayergraphene
AT gemmingt directimagingofrotationalstackingfaultsinfewlayergraphene
AT buchnerb directimagingofrotationalstackingfaultsinfewlayergraphene
AT briggsg directimagingofrotationalstackingfaultsinfewlayergraphene