Direct imaging of rotational stacking faults in few layer graphene

Direct imaging of rotational stacking faults in few layer graphene

Εμφάνιση άλλων εκδόσεων (1)

Few layer graphene nanostructures are directiy imaged using aberration corrected high-resolution transmission electron microscopy with an electron accelerating voltage of 80 kV. We observe rotational stacking faults in the HRTEM images of 2-6 layers of graphene sheets, giving rise to Moiré patterns....

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Warner, J, Rümmeli, M, Gemming, T, Büchner, B, Briggs, G
Μορφή:	Journal article
Γλώσσα:	English
Έκδοση:	2009

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