Direct imaging of rotational stacking faults in few layer graphene

Direct imaging of rotational stacking faults in few layer graphene

Бусад хувилбаруудыг харуулах (1)

Few layer graphene nanostructures are directiy imaged using aberration corrected high-resolution transmission electron microscopy with an electron accelerating voltage of 80 kV. We observe rotational stacking faults in the HRTEM images of 2-6 layers of graphene sheets, giving rise to Moiré patterns....

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй
Үндсэн зохиолчид:	Warner, J, Rümmeli, M, Gemming, T, Büchner, B, Briggs, G
Формат:	Journal article
Хэл сонгох:	English
Хэвлэсэн:	2009

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