Direct imaging of rotational stacking faults in few layer graphene
Few layer graphene nanostructures are directiy imaged using aberration corrected high-resolution transmission electron microscopy with an electron accelerating voltage of 80 kV. We observe rotational stacking faults in the HRTEM images of 2-6 layers of graphene sheets, giving rise to Moiré patterns....
| Päätekijät: | , , , , |
|---|---|
| Aineistotyyppi: | Journal article |
| Kieli: | English |
| Julkaistu: |
2009
|
Search Result 1
