Electrical Characterization and Preliminary Beam Test Results of 3D Silicon CMS Pixel Detectors

Electrical Characterization and Preliminary Beam Test Results of 3D Silicon CMS Pixel Detectors

The fabrication of 3D detectors which requires bulk micromachining of columnar electrodes has been realized with advancements in MEMS technology. Since the fabrication of the first 3D prototype in Stanford Nanofabrication Facility in 1997, a significant effort has been put forth to transfer the 3D d...

সম্পূর্ণ বিবরণ

গ্রন্থ-পঞ্জীর বিবরন
প্রধান লেখক: Koybasi, O, Alagoz, E, Krzywda, A, Arndt, K, Bolla, G, Bortoletto, D, Hansen, T, Jensen, G, Kok, A, Kwan, S, Lietaer, N, Rivera, R, Shipsey, I, Uplegger, L, Da Via, C
বিন্যাস: Journal article
ভাষা:English
প্রকাশিত: 2011

অনুরূপ উপাদানগুলি

অনুরূপ উপাদানগুলি