Стиль цитування APA (7-ме видання)

Bett, D., Burrows, P., Perry, C., Ramjiawan, R., Terunuma, N., Kubo, K., & Okugi, T. (2022). A sub-micron resolution, bunch-by-bunch beam trajectory feedback system and its application to reducing wakefield effects in single-pass beamline. IOP Publishing.

Чикаго стиль цитування (17-те видання)

Bett, DR, PN Burrows, C. Perry, R. Ramjiawan, N. Terunuma, K. Kubo, та T. Okugi. A Sub-micron Resolution, Bunch-by-bunch Beam Trajectory Feedback System and Its Application to Reducing Wakefield Effects in Single-pass Beamline. IOP Publishing, 2022.

Стиль цитування MLA (9-ме видання)

Bett, DR, et al. A Sub-micron Resolution, Bunch-by-bunch Beam Trajectory Feedback System and Its Application to Reducing Wakefield Effects in Single-pass Beamline. IOP Publishing, 2022.