A sub-micron resolution, bunch-by-bunch beam trajectory feedback system and its application to reducing wakefield effects in single-pass beamline

A sub-micron resolution, bunch-by-bunch beam trajectory feedback system and its application to reducing wakefield effects in single-pass beamline

A high-precision intra-bunch-train beam orbit feedback correction system has been developed and tested in the ATF2 beamline of the Accelerator Test Facility at the High Energy Accelerator Research Organization in Japan. The system uses the vertical position of the bunch measured at two beam position...

書目詳細資料
Main Authors:	Bett, DR, Burrows, PN, Perry, C, Ramjiawan, R, Terunuma, N, Kubo, K, Okugi, T
格式:	Journal article
語言:	English
出版:	IOP Publishing 2022

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