Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction

Using time-resolved x-ray diffraction ultafast lattice dynamics in fs-laser-excited crystalline bulk Ge and Ge/Si-heterostructures has been studied. This experimental technique uniquely allows us to observe fast energy transport deep into. the bulk of the material, coherent acoustic phonon dynamics,...

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Dades bibliogràfiques
Autors principals: Sokolowski-Tinten, K, von Hoegen, M, von der Linde, D, Cavalleri, A, Siders, C, Brown, F, Leitner, D, Toth, C, Squier, J, Bart, C, Wilson, K, Kammler, M
Format: Conference item
Publicat: 2001
Descripció
Sumari:Using time-resolved x-ray diffraction ultafast lattice dynamics in fs-laser-excited crystalline bulk Ge and Ge/Si-heterostructures has been studied. This experimental technique uniquely allows us to observe fast energy transport deep into. the bulk of the material, coherent acoustic phonon dynamics, lattice anharmonicity, and vibrational transport across a buried interface.