Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction
Using time-resolved x-ray diffraction ultafast lattice dynamics in fs-laser-excited crystalline bulk Ge and Ge/Si-heterostructures has been studied. This experimental technique uniquely allows us to observe fast energy transport deep into. the bulk of the material, coherent acoustic phonon dynamics,...
| Hlavní autoři: | , , , , , , , , , , , |
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| Médium: | Conference item |
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2001
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| _version_ | 1826260086261022720 |
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| author | Sokolowski-Tinten, K von Hoegen, M von der Linde, D Cavalleri, A Siders, C Brown, F Leitner, D Toth, C Squier, J Bart, C Wilson, K Kammler, M |
| author_facet | Sokolowski-Tinten, K von Hoegen, M von der Linde, D Cavalleri, A Siders, C Brown, F Leitner, D Toth, C Squier, J Bart, C Wilson, K Kammler, M |
| author_sort | Sokolowski-Tinten, K |
| collection | OXFORD |
| description | Using time-resolved x-ray diffraction ultafast lattice dynamics in fs-laser-excited crystalline bulk Ge and Ge/Si-heterostructures has been studied. This experimental technique uniquely allows us to observe fast energy transport deep into. the bulk of the material, coherent acoustic phonon dynamics, lattice anharmonicity, and vibrational transport across a buried interface. |
| first_indexed | 2024-03-06T19:00:02Z |
| format | Conference item |
| id | oxford-uuid:13355be6-ca4c-47d6-947d-3898da34dd3e |
| institution | University of Oxford |
| last_indexed | 2024-03-06T19:00:02Z |
| publishDate | 2001 |
| record_format | dspace |
| spelling | oxford-uuid:13355be6-ca4c-47d6-947d-3898da34dd3e2022-03-26T10:12:42ZTransient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffractionConference itemhttp://purl.org/coar/resource_type/c_5794uuid:13355be6-ca4c-47d6-947d-3898da34dd3eSymplectic Elements at Oxford2001Sokolowski-Tinten, Kvon Hoegen, Mvon der Linde, DCavalleri, ASiders, CBrown, FLeitner, DToth, CSquier, JBart, CWilson, KKammler, MUsing time-resolved x-ray diffraction ultafast lattice dynamics in fs-laser-excited crystalline bulk Ge and Ge/Si-heterostructures has been studied. This experimental technique uniquely allows us to observe fast energy transport deep into. the bulk of the material, coherent acoustic phonon dynamics, lattice anharmonicity, and vibrational transport across a buried interface. |
| spellingShingle | Sokolowski-Tinten, K von Hoegen, M von der Linde, D Cavalleri, A Siders, C Brown, F Leitner, D Toth, C Squier, J Bart, C Wilson, K Kammler, M Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction |
| title | Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction |
| title_full | Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction |
| title_fullStr | Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction |
| title_full_unstemmed | Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction |
| title_short | Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction |
| title_sort | transient lattice dynamics in fs laser excited semiconductors probed by ultrafast x ray diffraction |
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