Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction

Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction

Silica photonic colloidal crystals on a flat glass substrate have been grown using the depletion attraction induced by nonadsorbing polymers. The dried samples have been characterised with high-resolution synchrotron small-angle X-ray diffraction and their surface topography has been studied by atom...

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Hlavní autoři: Xian, X, Petukhov, A, Snel, MME, Dolbnya, I, Aarts, D, Vroege, G, Lekkerkerker, H
Médium: Conference item
Vydáno: 2003
Popis
Shrnutí:Silica photonic colloidal crystals on a flat glass substrate have been grown using the depletion attraction induced by nonadsorbing polymers. The dried samples have been characterised with high-resolution synchrotron small-angle X-ray diffraction and their surface topography has been studied by atomic force microscopy. The presence of long-range ordered crystals with a thickness as large as 90 planes is demonstrated. However, on some places the films are polycrystalline and contain disordered regions.

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