Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction

Silica photonic colloidal crystals on a flat glass substrate have been grown using the depletion attraction induced by nonadsorbing polymers. The dried samples have been characterised with high-resolution synchrotron small-angle X-ray diffraction and their surface topography has been studied by atom...

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Հիմնական հեղինակներ: Xian, X, Petukhov, A, Snel, MME, Dolbnya, I, Aarts, D, Vroege, G, Lekkerkerker, H
Ձևաչափ: Conference item
Հրապարակվել է: 2003
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author Xian, X
Petukhov, A
Snel, MME
Dolbnya, I
Aarts, D
Vroege, G
Lekkerkerker, H
author_facet Xian, X
Petukhov, A
Snel, MME
Dolbnya, I
Aarts, D
Vroege, G
Lekkerkerker, H
author_sort Xian, X
collection OXFORD
description Silica photonic colloidal crystals on a flat glass substrate have been grown using the depletion attraction induced by nonadsorbing polymers. The dried samples have been characterised with high-resolution synchrotron small-angle X-ray diffraction and their surface topography has been studied by atomic force microscopy. The presence of long-range ordered crystals with a thickness as large as 90 planes is demonstrated. However, on some places the films are polycrystalline and contain disordered regions.
first_indexed 2024-03-06T19:01:03Z
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id oxford-uuid:138a9d0c-c4f0-4f2f-a49c-af2172116bf6
institution University of Oxford
last_indexed 2024-03-06T19:01:03Z
publishDate 2003
record_format dspace
spelling oxford-uuid:138a9d0c-c4f0-4f2f-a49c-af2172116bf62022-03-26T10:14:25ZDepletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffractionConference itemhttp://purl.org/coar/resource_type/c_5794uuid:138a9d0c-c4f0-4f2f-a49c-af2172116bf6Symplectic Elements at Oxford2003Xian, XPetukhov, ASnel, MMEDolbnya, IAarts, DVroege, GLekkerkerker, HSilica photonic colloidal crystals on a flat glass substrate have been grown using the depletion attraction induced by nonadsorbing polymers. The dried samples have been characterised with high-resolution synchrotron small-angle X-ray diffraction and their surface topography has been studied by atomic force microscopy. The presence of long-range ordered crystals with a thickness as large as 90 planes is demonstrated. However, on some places the films are polycrystalline and contain disordered regions.
spellingShingle Xian, X
Petukhov, A
Snel, MME
Dolbnya, I
Aarts, D
Vroege, G
Lekkerkerker, H
Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction
title Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction
title_full Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction
title_fullStr Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction
title_full_unstemmed Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction
title_short Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction
title_sort depletion induced colloidal crystals at a wall characterised by small angle x ray diffraction
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AT dolbnyai depletioninducedcolloidalcrystalsatawallcharacterisedbysmallanglexraydiffraction
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