Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction
Silica photonic colloidal crystals on a flat glass substrate have been grown using the depletion attraction induced by nonadsorbing polymers. The dried samples have been characterised with high-resolution synchrotron small-angle X-ray diffraction and their surface topography has been studied by atom...
Հիմնական հեղինակներ: | , , , , , , |
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Ձևաչափ: | Conference item |
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2003
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author | Xian, X Petukhov, A Snel, MME Dolbnya, I Aarts, D Vroege, G Lekkerkerker, H |
author_facet | Xian, X Petukhov, A Snel, MME Dolbnya, I Aarts, D Vroege, G Lekkerkerker, H |
author_sort | Xian, X |
collection | OXFORD |
description | Silica photonic colloidal crystals on a flat glass substrate have been grown using the depletion attraction induced by nonadsorbing polymers. The dried samples have been characterised with high-resolution synchrotron small-angle X-ray diffraction and their surface topography has been studied by atomic force microscopy. The presence of long-range ordered crystals with a thickness as large as 90 planes is demonstrated. However, on some places the films are polycrystalline and contain disordered regions. |
first_indexed | 2024-03-06T19:01:03Z |
format | Conference item |
id | oxford-uuid:138a9d0c-c4f0-4f2f-a49c-af2172116bf6 |
institution | University of Oxford |
last_indexed | 2024-03-06T19:01:03Z |
publishDate | 2003 |
record_format | dspace |
spelling | oxford-uuid:138a9d0c-c4f0-4f2f-a49c-af2172116bf62022-03-26T10:14:25ZDepletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffractionConference itemhttp://purl.org/coar/resource_type/c_5794uuid:138a9d0c-c4f0-4f2f-a49c-af2172116bf6Symplectic Elements at Oxford2003Xian, XPetukhov, ASnel, MMEDolbnya, IAarts, DVroege, GLekkerkerker, HSilica photonic colloidal crystals on a flat glass substrate have been grown using the depletion attraction induced by nonadsorbing polymers. The dried samples have been characterised with high-resolution synchrotron small-angle X-ray diffraction and their surface topography has been studied by atomic force microscopy. The presence of long-range ordered crystals with a thickness as large as 90 planes is demonstrated. However, on some places the films are polycrystalline and contain disordered regions. |
spellingShingle | Xian, X Petukhov, A Snel, MME Dolbnya, I Aarts, D Vroege, G Lekkerkerker, H Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction |
title | Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction |
title_full | Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction |
title_fullStr | Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction |
title_full_unstemmed | Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction |
title_short | Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction |
title_sort | depletion induced colloidal crystals at a wall characterised by small angle x ray diffraction |
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