Semi-insulating Czochralski-silicon for radio frequency applications
Deep level manganese doping by ion implantation and rapid thermal annealing have been used for the first time to make very high resistivity Czoehralski silicon substrates up to 10 k Omega cm and on the average, this is nearly a ten-fold increase over the resistivity of the undoped starting wafer. Th...
Main Authors: | Mallik, K, Groot, d, Ashburn, P, Wilshaw, P |
---|---|
Format: | Conference item |
Published: |
2006
|
Similar Items
-
Enhancement of resistivity of Czochralski silicon by deep level manganese doping
by: Mallik, K, et al.
Published: (2006) -
Deep level impurity engineered semi-insulating Cz-silicon as microwave substrates
by: Mallik, K, et al.
Published: (2011) -
Reduced microwave attenuation in coplanar waveguides using deep level impurity compensated Czochralski-silicon substrates
by: Abuelgasim, A, et al.
Published: (2011) -
Semi-insulating silicon for microwave devices
by: Jordan, D, et al.
Published: (2009) -
The development of semi-insulating silicon substrates for microwave devices
by: Jordan, D, et al.
Published: (2008)