Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling
The preparation of transmission electron microscope (TEM) thin foil specimens from metal alloys containing cracks is usually thwarted by the difficulty in preventing preferential erosion of material along the flanks and at the tips of cracks. Recent developments in focused ion beam (FIB) micromachin...
| Main Authors: | , , , , |
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| Format: | Journal article |
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2002
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| _version_ | 1797055513754599424 |
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| author | Huang, Y Lozano-Perez, S Langford, R Titchmarsh, J Jenkins, M |
| author_facet | Huang, Y Lozano-Perez, S Langford, R Titchmarsh, J Jenkins, M |
| author_sort | Huang, Y |
| collection | OXFORD |
| description | The preparation of transmission electron microscope (TEM) thin foil specimens from metal alloys containing cracks is usually thwarted by the difficulty in preventing preferential erosion of material along the flanks and at the tips of cracks. Recent developments in focused ion beam (FIB) micromachining methods have the potential to overcome this inherent problem. In this article we describe the development of new procedures, one using FIB alone and the other using a combination of FIB with more conventional ion milling to generate TEM specimens that largely retain the microstructural information at stress corrosion cracks in austentic alloys. Examples of corrosion product phase identification and interfacial segregation are included to verify that detailed information is not destroyed by ion bombardment during specimen preparation. |
| first_indexed | 2024-03-06T19:11:44Z |
| format | Journal article |
| id | oxford-uuid:17011c62-5ec3-4548-b59b-b64709ec6394 |
| institution | University of Oxford |
| last_indexed | 2024-03-06T19:11:44Z |
| publishDate | 2002 |
| record_format | dspace |
| spelling | oxford-uuid:17011c62-5ec3-4548-b59b-b64709ec63942022-03-26T10:34:38ZPreparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam millingJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:17011c62-5ec3-4548-b59b-b64709ec6394Symplectic Elements at Oxford2002Huang, YLozano-Perez, SLangford, RTitchmarsh, JJenkins, MThe preparation of transmission electron microscope (TEM) thin foil specimens from metal alloys containing cracks is usually thwarted by the difficulty in preventing preferential erosion of material along the flanks and at the tips of cracks. Recent developments in focused ion beam (FIB) micromachining methods have the potential to overcome this inherent problem. In this article we describe the development of new procedures, one using FIB alone and the other using a combination of FIB with more conventional ion milling to generate TEM specimens that largely retain the microstructural information at stress corrosion cracks in austentic alloys. Examples of corrosion product phase identification and interfacial segregation are included to verify that detailed information is not destroyed by ion bombardment during specimen preparation. |
| spellingShingle | Huang, Y Lozano-Perez, S Langford, R Titchmarsh, J Jenkins, M Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling |
| title | Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling |
| title_full | Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling |
| title_fullStr | Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling |
| title_full_unstemmed | Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling |
| title_short | Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling |
| title_sort | preparation of transmission electron microscopy cross section specimens of crack tips using focused ion beam milling |
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