Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling

Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling

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The preparation of transmission electron microscope (TEM) thin foil specimens from metal alloys containing cracks is usually thwarted by the difficulty in preventing preferential erosion of material along the flanks and at the tips of cracks. Recent developments in focused ion beam (FIB) micromachin...

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Bibliographic Details
Main Authors:	Huang, Y, Lozano-Perez, S, Langford, R, Titchmarsh, J, Jenkins, M
Format:	Journal article
Published:	2002

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