Bayesian nonparametric system reliability using sets of priors

An imprecise Bayesian nonparametric approach to system reliability with multiple types of components is developed. This allows modelling partial or imperfect prior knowledge on component failure distributions in a flexible way through bounds on the functioning probability. Given component level te...

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Main Authors: Walter, G, Aslett, L, Coolen, F
Format: Journal article
Language:English
Published: Elsevier 2016
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author Walter, G
Aslett, L
Coolen, F
author_facet Walter, G
Aslett, L
Coolen, F
author_sort Walter, G
collection OXFORD
description An imprecise Bayesian nonparametric approach to system reliability with multiple types of components is developed. This allows modelling partial or imperfect prior knowledge on component failure distributions in a flexible way through bounds on the functioning probability. Given component level test data these bounds are propagated to bounds on the posterior predictive distribution for the functioning probability of a new system containing components exchangeable with those used in testing. The method further enables identification of prior-data conflict at the system level based on component level test data. New results on first-order stochastic dominance for the Beta-Binomial distribution make the technique computationally tractable. Our methodological contributions can be immediately used in applications by reliability practitioners as we provide easy to use software tools.
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spelling oxford-uuid:17309046-8612-455b-b0c9-9f2dc3d365a52022-03-26T10:35:48ZBayesian nonparametric system reliability using sets of priorsJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:17309046-8612-455b-b0c9-9f2dc3d365a5EnglishSymplectic Elements at OxfordElsevier2016Walter, GAslett, LCoolen, FAn imprecise Bayesian nonparametric approach to system reliability with multiple types of components is developed. This allows modelling partial or imperfect prior knowledge on component failure distributions in a flexible way through bounds on the functioning probability. Given component level test data these bounds are propagated to bounds on the posterior predictive distribution for the functioning probability of a new system containing components exchangeable with those used in testing. The method further enables identification of prior-data conflict at the system level based on component level test data. New results on first-order stochastic dominance for the Beta-Binomial distribution make the technique computationally tractable. Our methodological contributions can be immediately used in applications by reliability practitioners as we provide easy to use software tools.
spellingShingle Walter, G
Aslett, L
Coolen, F
Bayesian nonparametric system reliability using sets of priors
title Bayesian nonparametric system reliability using sets of priors
title_full Bayesian nonparametric system reliability using sets of priors
title_fullStr Bayesian nonparametric system reliability using sets of priors
title_full_unstemmed Bayesian nonparametric system reliability using sets of priors
title_short Bayesian nonparametric system reliability using sets of priors
title_sort bayesian nonparametric system reliability using sets of priors
work_keys_str_mv AT walterg bayesiannonparametricsystemreliabilityusingsetsofpriors
AT aslettl bayesiannonparametricsystemreliabilityusingsetsofpriors
AT coolenf bayesiannonparametricsystemreliabilityusingsetsofpriors