Cita APA (7a ed.)

Silk, T., Hong, Q., Tamm, J., & Compton, R. (1998). AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis.

Cita Chicago Style (17a ed.)

Silk, T., Q. Hong, J. Tamm, y R. Compton. AFM Studies of Polypyrrole Film Surface Morphology - II. Roughness Characterization by the Fractal Dimension Analysis. 1998.

Cita MLA (9a ed.)

Silk, T., et al. AFM Studies of Polypyrrole Film Surface Morphology - II. Roughness Characterization by the Fractal Dimension Analysis. 1998.