Silk, T., Hong, Q., Tamm, J., & Compton, R. (1998). AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis.
शिकागो शैली (17वां संस्करण) प्रशस्ति पत्रSilk, T., Q. Hong, J. Tamm, और R. Compton. AFM Studies of Polypyrrole Film Surface Morphology - II. Roughness Characterization by the Fractal Dimension Analysis. 1998.
एमएलए (9वां संस्करण) प्रशस्ति पत्रSilk, T., et al. AFM Studies of Polypyrrole Film Surface Morphology - II. Roughness Characterization by the Fractal Dimension Analysis. 1998.
चेतावनी: ये उद्धरण हमेशा 100% सटीक नहीं हो सकते हैं.