Silk, T., Hong, Q., Tamm, J., & Compton, R. (1998). AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis.
Citazione stile Chigago Style (17a edizione)Silk, T., Q. Hong, J. Tamm, e R. Compton. AFM Studies of Polypyrrole Film Surface Morphology - II. Roughness Characterization by the Fractal Dimension Analysis. 1998.
Citatione MLA (9a ed.)Silk, T., et al. AFM Studies of Polypyrrole Film Surface Morphology - II. Roughness Characterization by the Fractal Dimension Analysis. 1998.
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