Silk, T., Hong, Q., Tamm, J., & Compton, R. (1998). AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis.
Chicago-čujuhus (17. p.)Silk, T., Q. Hong, J. Tamm, juo R. Compton. AFM Studies of Polypyrrole Film Surface Morphology - II. Roughness Characterization by the Fractal Dimension Analysis. 1998.
MLA-čujuhus (9. p.)Silk, T., et al. AFM Studies of Polypyrrole Film Surface Morphology - II. Roughness Characterization by the Fractal Dimension Analysis. 1998.
Muitte dárkkistit čujuhemiid riektatvuođa, ovdal go geavahat daid iežat deavsttas.