Silk, T., Hong, Q., Tamm, J., & Compton, R. (1998). AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis.
芝加哥风格引文Silk, T., Q. Hong, J. Tamm, 与 R. Compton. AFM Studies of Polypyrrole Film Surface Morphology - II. Roughness Characterization by the Fractal Dimension Analysis. 1998.
MLA引文Silk, T., et al. AFM Studies of Polypyrrole Film Surface Morphology - II. Roughness Characterization by the Fractal Dimension Analysis. 1998.
警告：这些引文格式不一定是100％准确.