AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis

The fractal dimension of electrogenerated polypyrrole films with chloride, sulfate, perchlorate and dodecylsulfate (DDS) anions as dopants is investigated by using atomic force microscopy under ex situ conditions. The results for films both as-prepared and after potentiodynamic cycling in various su...

Full description

Bibliographic Details
Main Authors: Silk, T, Hong, Q, Tamm, J, Compton, R
Format: Journal article
Language:English
Published: 1998
_version_ 1826260887462215680
author Silk, T
Hong, Q
Tamm, J
Compton, R
author_facet Silk, T
Hong, Q
Tamm, J
Compton, R
author_sort Silk, T
collection OXFORD
description The fractal dimension of electrogenerated polypyrrole films with chloride, sulfate, perchlorate and dodecylsulfate (DDS) anions as dopants is investigated by using atomic force microscopy under ex situ conditions. The results for films both as-prepared and after potentiodynamic cycling in various supporting electrolytes is presented and discussed. © 1998 Elsevier Science S.A.
first_indexed 2024-03-06T19:12:51Z
format Journal article
id oxford-uuid:1757e726-8efc-49c7-83c9-1abffe2c4157
institution University of Oxford
language English
last_indexed 2024-03-06T19:12:51Z
publishDate 1998
record_format dspace
spelling oxford-uuid:1757e726-8efc-49c7-83c9-1abffe2c41572022-03-26T10:36:46ZAFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysisJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:1757e726-8efc-49c7-83c9-1abffe2c4157EnglishSymplectic Elements at Oxford1998Silk, THong, QTamm, JCompton, RThe fractal dimension of electrogenerated polypyrrole films with chloride, sulfate, perchlorate and dodecylsulfate (DDS) anions as dopants is investigated by using atomic force microscopy under ex situ conditions. The results for films both as-prepared and after potentiodynamic cycling in various supporting electrolytes is presented and discussed. © 1998 Elsevier Science S.A.
spellingShingle Silk, T
Hong, Q
Tamm, J
Compton, R
AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis
title AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis
title_full AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis
title_fullStr AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis
title_full_unstemmed AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis
title_short AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis
title_sort afm studies of polypyrrole film surface morphology ii roughness characterization by the fractal dimension analysis
work_keys_str_mv AT silkt afmstudiesofpolypyrrolefilmsurfacemorphologyiiroughnesscharacterizationbythefractaldimensionanalysis
AT hongq afmstudiesofpolypyrrolefilmsurfacemorphologyiiroughnesscharacterizationbythefractaldimensionanalysis
AT tammj afmstudiesofpolypyrrolefilmsurfacemorphologyiiroughnesscharacterizationbythefractaldimensionanalysis
AT comptonr afmstudiesofpolypyrrolefilmsurfacemorphologyiiroughnesscharacterizationbythefractaldimensionanalysis