Femtosecond melting and ablation of semiconductors studied with time of flight mass spectroscopy

Femtosecond melting and ablation of semiconductors studied with time of flight mass spectroscopy

Bibliographic Details
Main Authors:	Cavalleri, A, Sokolowski-Tinten, K, Bialkowski, J, Schreiner, M, von der Linde, D
Format:	Journal article
Published:	1999

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