Determination of SAW phase velocities on the nanoscale

This paper reports about the first determination of the phase velocity of surface acoustic waves (SAWs) on the nanometer scale. With a scanning acoustic force microscope (SAFM) a maximum lateral resolution of 19.9 nm has been achieved. This is almost two orders of magnitude better than the resolutio...

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Manylion Llyfryddiaeth
Prif Awduron: Hesjedal, T, Chilla, E, Frohlich, H
Fformat: Conference item
Cyhoeddwyd: 1996
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author Hesjedal, T
Chilla, E
Frohlich, H
author_facet Hesjedal, T
Chilla, E
Frohlich, H
author_sort Hesjedal, T
collection OXFORD
description This paper reports about the first determination of the phase velocity of surface acoustic waves (SAWs) on the nanometer scale. With a scanning acoustic force microscope (SAFM) a maximum lateral resolution of 19.9 nm has been achieved. This is almost two orders of magnitude better than the resolution of standard quantitative acoustic microscopy. The key of measuring the phase of high frequency signals with a slowly responding SAFM cantilever is frequency mixing at its non-linear force curve. For demonstrating its abilities SAW dispersion was studied on Au layers of different thicknesses by SAFM over a lateral distance of down to 200 nm.
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spelling oxford-uuid:186c10bf-12a0-4341-9474-173d00c8e6b52022-03-26T10:43:07ZDetermination of SAW phase velocities on the nanoscaleConference itemhttp://purl.org/coar/resource_type/c_5794uuid:186c10bf-12a0-4341-9474-173d00c8e6b5Symplectic Elements at Oxford1996Hesjedal, TChilla, EFrohlich, HThis paper reports about the first determination of the phase velocity of surface acoustic waves (SAWs) on the nanometer scale. With a scanning acoustic force microscope (SAFM) a maximum lateral resolution of 19.9 nm has been achieved. This is almost two orders of magnitude better than the resolution of standard quantitative acoustic microscopy. The key of measuring the phase of high frequency signals with a slowly responding SAFM cantilever is frequency mixing at its non-linear force curve. For demonstrating its abilities SAW dispersion was studied on Au layers of different thicknesses by SAFM over a lateral distance of down to 200 nm.
spellingShingle Hesjedal, T
Chilla, E
Frohlich, H
Determination of SAW phase velocities on the nanoscale
title Determination of SAW phase velocities on the nanoscale
title_full Determination of SAW phase velocities on the nanoscale
title_fullStr Determination of SAW phase velocities on the nanoscale
title_full_unstemmed Determination of SAW phase velocities on the nanoscale
title_short Determination of SAW phase velocities on the nanoscale
title_sort determination of saw phase velocities on the nanoscale
work_keys_str_mv AT hesjedalt determinationofsawphasevelocitiesonthenanoscale
AT chillae determinationofsawphasevelocitiesonthenanoscale
AT frohlichh determinationofsawphasevelocitiesonthenanoscale