Complete spatial characterization of an optical wavefront using a variable-separation pinhole pair.
We present a technique for measuring the transverse spatial properties of an optical wavefront. Intensity and phase profiles are recovered by analysis of a series of interference patterns produced by the combination of a scanning X-shaped slit and a static horizontal slit; the spatial coherence may...
| Main Authors: | , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2013
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